tccgen.c:
doubles need to be aligned, on ARM. The section_reserve()
in init_putv does not do that.
-D ONE_SOURCE: is now the default and not longer needed. Also,
tcc.h now sets the default native target. These both make
compiling tcc simple as "gcc tcc.c -o tcc -ldl" again.
arm-asm.c:
enable pseudo asm also for inline asm
tests/tests2/Makefile:
disable bitfield tests except on windows and x86_64
and don't generate-always
tcc.c:
fix a loop with -dt on errors
configure:
print compiler version (as recognized)
tccpp.c:
actually define symbols for tcc -dt
clear static variables (needed for -dt or libtcc usage)
96_nodata_wanted.c:
use __label__ instead of asm
lib/files:
use native symbols (__i386__ etc.) instead of TCC_TARGET_...
The existing variable 'nocode_wanted' is now used to control
output of static data too. So...
(nocode_wanted == 0)
code and data (normal within functions)
(nocode_wanted < 0)
means: no code, but data (global or static data)
(nocode_wanted > 0)
means: no code and no data (code and data suppressed)
(nocode_wanted & 0xC0000000)
means: we're in declaration of static data
Also: new option '-dT' to be used with -run
tcc -dT -run file.c
This will look in file.c for certain comment-boundaries:
/*-* test-xxx: ...some description */
and then for each test below run it from memory. This way
various features and error messages can be tested with one
single file. See 96_nodata_wanted.c for an example.
Also: tccgen.c: one more bitfield fix
tccpp.c:
* #pragma comment(option,"-some-option")
to set commandline option from C code. May work only
for some options.
libtcc.c:
* option "-d1..9": sets a 'g_debug' global variable.
(for development)
tests2/Makefile:
* new make targets: tests2.37 / tests2.37+
run single test from tests2, optionally update .expect
* new variable GEN-ALWAYS to always generate certain .expects
* bitfields test
tccgen.c:
* bitfields: fix a bug and improve slightly more
* _Generic: ignore "type match twice"
