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Note that BadRAM patterns exclude errors found in tests 0 and 7.

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This was mentioned in the individual test descriptions in the README,
but easily missed (issue #384). Add a note in the BadRAM section of
the README and also in the error display heading.
This commit is contained in:
Martin Whitaker 2024-03-05 23:06:57 +00:00
parent 7b70c6e026
commit ded371e9da
2 changed files with 8 additions and 3 deletions
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5
README.md
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@ -358,6 +358,11 @@ number of practical reasons. As a result, handcrafting patterns from the
output in address printing mode may, in exceptional cases, yield better
results.
**NOTE** As mentioned in the individual test descriptions, the walking-ones
address test (test 0) and the block move test (test 7) do not contribute to
the BadRAM patterns as these tests do not allow the exact address of the
fault to be determined.
## Trouble-shooting Memory Errors
Please be aware that not all errors reported by Memtest86+ are due to bad

6
app/badram.c
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@ -1,5 +1,5 @@
// SPDX-License-Identifier: GPL-2.0
// Copyright (C) 2020 Martin Whitaker.
// Copyright (C) 2020-2024 Martin Whitaker.
//
// Derived from memtest86+ patn.c:
//
@ -268,8 +268,8 @@ void badram_display(void)
check_input();
clear_message_area();
display_pinned_message(0, 0, "BadRAM Patterns");
display_pinned_message(1, 0, "---------------");
display_pinned_message(0, 0, "BadRAM Patterns (excludes test 0 and test 7)");
display_pinned_message(1, 0, "--------------------------------------------");
scroll();
display_scrolled_message(0, "badram=");
int col = 7;