mirror of
https://github.com/memtest86plus/memtest86plus
synced 2025-03-13 09:23:10 +03:00
Various fixes to README.
This commit is contained in:
parent
fbd3376668
commit
165f512f0a
51
README.md
51
README.md
@ -10,18 +10,18 @@ protocol. It should work on any Pentium class or later CPU.
|
||||
|
||||
## Table of Contents
|
||||
|
||||
* [Origins]
|
||||
* [Licensing]
|
||||
* [Build and Installation]
|
||||
* [Operation]
|
||||
* [Error Display]
|
||||
* [Trouble-shooting Memory Errors]
|
||||
* [Execution Time]
|
||||
* [Memory Testing Philosophy]
|
||||
* [PCMemTest Test Algorithms]
|
||||
* [Individual Test Descriptions]
|
||||
* [Known Limitations and Bugs]
|
||||
* [Acknowledgments]
|
||||
* [Origins](#origins)
|
||||
* [Licensing](#licensing)
|
||||
* [Build and Installation](#build-and-installation)
|
||||
* [Operation](#operation)
|
||||
* [Error Display](#error-display)
|
||||
* [Trouble-shooting Memory Errors](#trouble-shooting-memory-errors)
|
||||
* [Execution Time](#execution-time)
|
||||
* [Memory Testing Philosophy](#memory-testing-philosophy)
|
||||
* [PCMemTest Test Algorithms](#pcmemtest-test-algorithms)
|
||||
* [Individual Test Descriptions](#individual-test-descriptions)
|
||||
* [Known Limitations and Bugs](#known-limitations-and-bugs)
|
||||
* [Acknowledgments](#acknowledgments)
|
||||
|
||||
## Origins
|
||||
|
||||
@ -307,15 +307,15 @@ inversions. The moving inversion tests work as follows:
|
||||
|
||||
1. Fill memory with a pattern
|
||||
2. Starting at the lowest address
|
||||
1. check that the pattern has not changed
|
||||
2. write the pattern's complement
|
||||
3. increment the address
|
||||
4. repeat 2.1 to 2.3
|
||||
1. check that the pattern has not changed
|
||||
2. write the pattern's complement
|
||||
3. increment the address
|
||||
4. repeat 2.1 to 2.3
|
||||
3. Starting at the highest address
|
||||
1. check that the pattern has not changed
|
||||
2. write the pattern's complement
|
||||
3. decrement the address
|
||||
4. repeat 3.1 - 3.3
|
||||
1. check that the pattern has not changed
|
||||
2. write the pattern's complement
|
||||
3. decrement the address
|
||||
4. repeat 3.1 - 3.3
|
||||
|
||||
This algorithm is a good approximation of an ideal memory test but there are
|
||||
some limitations. Most high density chips today store data 4 to 16 bits wide.
|
||||
@ -333,10 +333,10 @@ algorithm called Modulo-20 was created. This algorithm is not affected by
|
||||
caching or buffering. The algorithm works as follows:
|
||||
|
||||
1. For starting offsets of 0 - 19 do
|
||||
1. write every 20th location with a pattern
|
||||
2. write all other locations with the pattern's complement
|
||||
3. repeat 1.2 one or more times
|
||||
4. check every 20th location for the pattern
|
||||
1. write every 20th location with a pattern
|
||||
2. write all other locations with the pattern's complement
|
||||
3. repeat 1.2 one or more times
|
||||
4. check every 20th location for the pattern
|
||||
|
||||
This algorithm accomplishes nearly the same level of adjacency testing as
|
||||
moving inversions but is not affected by caching or buffering. Since separate
|
||||
@ -469,3 +469,6 @@ and assistance listed below:
|
||||
* Major enhancements to hardware detection and reporting in version 3.2, 3.3
|
||||
and 3.4 provided by Samuel Demeulemeester (from Memtest86+ v1.11, v1.60
|
||||
and v1.70).
|
||||
|
||||
In addition, several bug fixes for Memtest86+ were imported from
|
||||
[anphsw/memtest86](https://github.com/anphsw/memtest86).
|
||||
|
Loading…
x
Reference in New Issue
Block a user