NetBSD/sbin/atactl/atactl.8

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.\" $NetBSD: atactl.8,v 1.14 2003/12/20 20:03:20 lha Exp $
.\"
.\" Copyright (c) 1998 The NetBSD Foundation, Inc.
.\" All rights reserved.
.\"
.\" This code is derived from software contributed to The NetBSD Foundation
.\" by Ken Hornstein.
.\"
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.\" modification, are permitted provided that the following conditions
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.Dd December 20, 2003
.Dt ATACTL 8
.Os
.Sh NAME
.Nm atactl
.Nd a program to manipulate ATA (IDE) devices
.Sh SYNOPSIS
.Nm
.Ar device
.Ar command
.Oo
.Ar arg Oo ...
.Oc
.Oc
.Sh DESCRIPTION
.Nm
allows a user or system administrator to issue commands to and otherwise
control devices which reside on standard IDE and ATA controllers.
It is used by specifying a device to manipulate,
the command to perform, and any arguments the command may require.
.Sh DEVICE COMMANDS
The following commands may be used on IDE and ATA devices.
Note that not all devices support all commands.
.Pp
.Cm identify
.Pp
Identify the specified device, displaying the device's vendor, product,
revision strings, and the device's capabilities.
.Pp
.Cm idle
.Pp
Place the specified device into Idle mode.
This mode may consume less power than Active mode.
.Pp
.Cm standby
.Pp
Place the specified device into Standby mode.
This mode will consume less power than Idle mode.
.Pp
.Cm sleep
.Pp
Place the specified device into Sleep mode.
This mode will consume less power than Standby mode,
but requires a device reset to resume operation.
Typically the
.Xr wd 4
driver performs this reset automatically,
but this should still be used with caution.
.Pp
.Cm setidle
.Ar idle-timer
.Pp
Places the specified device into Idle mode,
and sets the Idle timer to
.Ar idle-timer
seconds.
A value of 0 will disable the Idle timer.
.Pp
.Cm setstandby
.Ar standby-timer
.Pp
Places the specified device into Standby mode,
and sets the Standby timer to
.Ar standby-timer
seconds.
A value of 0 will disable the Standby timer.
.Pp
.Cm checkpower
.Pp
Will print out if the device is in Active, Idle, or Standby power
management mode.
.Pp
.Cm smart
.Ar [enable | disable | status | selftest-log]
.Pp
Controls SMART feature set of the specified device.
SMART stands for Self-Monitoring, Analysis, and Reporting Technology.
It provides an early warning system by comparing subtle operation
characteristics to those determined in vendor testing
to precede device failures.
.Pp
.Ar enable
.Pp
Enables access to SMART capabilities within the device.
Prior to being enabled, a SMART capable device neither
monitors nor saves SMART attribute values.
The state of SMART, either enabled or disabled, will
be preserved by the device across power cycles.
.Pp
.Ar disable
.Pp
Disables access to SMART capabilities within the device.
Attribute values will be saved, and will no longer be monitored.
.Pp
.Ar status
.Pp
Reports whether SMART is supported by the device, and whether SMART is
enabled on the device (can only be determined on ATA6 or better devices).
If SMART is enabled, then a table of attribute information is printed.
Attributes are the specific performance or calibration parameters that
are used in analyzing the status of the device.
The specific set of attributes being used and the identity of
these attributes is vendor specific and proprietary.
.Pp
Attribute values are used to represent the relative reliability of
individual performance or calibration parameters.
The valid range of attribute values is from 1 to 253 decimal.
Lower values indicate that the analysis algorithms being used by the device
are predicting a higher probability of a degrading or faulty condition.
.Pp
Each attribute value has a corresponding threshold limit which is used for
direct comparison to the attribute value to indicate the existence of a
degrading or faulty condition.
The numerical value of the attribute thresholds are determined by the
device manufacturer through design and reliability testing and analysis.
Each attribute threshold represents the lowest limit to which its
corresponding attribute value can equal while still retaining a
positive reliability status.
.Pp
If the crit field is "yes" then negative reliability of this attribute
predicts imminent data loss.
Otherwise it merely indicates that the intended design life period
of usage or age has been exceeded.
The collect field indicates whether this attribute is updated while the
device is online.
The reliability field indicates whether the attribute
value is within the acceptable threshold.
.Pp
.Ar selftest-log
Print the selftest log.
.Sh SEE ALSO
.Xr ioctl 2 ,
.Xr wd 4
.Sh HISTORY
The
.Nm
command first appeared in
.Nx 1.4 .
.Sh AUTHORS
The
.Nm
command was written by Ken Hornstein.
It was based heavily on the
.Xr scsictl 8
command written by Jason R. Thorpe.
.Sh BUGS
The output from the
.Cm identify
command is rather ugly.